JESD22A101D.docx

JESD22A101D.docx

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JESD22A101D

JESD22-A101D

JEDECSTANDARDSteady-StateTemperature-HumidityBiasLifeTestJESD22-A101D（RevisionofJESD22-A101C,March2009）JULY2015JEDECSOLIDSTATETECHNOLOGYASSOCIATION

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JEDECStandardNo.22-A101DPage1TESTMETHODA101DSTEADY-STATETEMPERATURE-HUMIDITYBIASLIFETEST（FromJEDECBoardBallotsJCB-96-64,JCB-09-10,andJCB-15-28,formulatedunderthecognizanceofJC-14.1CommitteeonReliabilityTestMethodsforPackagedDevices.）1ScopeTheSteady-StateTemperature-HumidityBiasLifeTestisperformedtoevaluatethereliabilityofnonhermeticpackagedICdevicesinhumidenvironments.Temperature,humidity,andbiasconditionsareappliedtoacceleratethepenetrationofmoisturethroughtheexternalprotectivematerial（encapsulantorseal）oralongtheinterfacebetweentheexternalprotectivematerialandthemetallicconductorswhichpassthroughit.2ApparatusThetestrequiresatemperature-humiditytestchambercapableofmaintainingaspecifiedtemperatureandrelativehumiditycontinuously,whileprovidingelectricalconnectionstothedevicesundertestinaspecifiedbiasingconfiguration.2.1TemperatureandrelativehumidityThechambermustbecapableofprovidingcontrolledconditionsoftemperatureandrelativehumidityduringramp-upto,andramp-downfrom,thespecifiedtestconditions.NOTECareshouldbetakentoensurethetestchamber（dry-bulb）temperatureexceedsthewet-bulbtemperatureatalltimes.2.2DevicesunderstressDevicesunderstressmustbephysicallylocatedtominimizetemperaturegradients.NOTECareshouldbetakentominimizerelativehumiditygradientsandmaximizeairflowbetweendevices.2.3MinimizereleaseofcontaminationCaremustbeexercisedinthechoiceofboardandsocketmaterialstominimizereleaseofcontamination,andtominimizedegradationduetocorrosionandothermechanisms.2.4IoniccontaminationIoniccontaminationfromthetestapparatus（e.g.,cardcage,testboards,sockets,wiring,storagecontainers,etc.）shallbecontrolledtoavoidtestartifacts.2.5DeionizedwaterDeionizedwaterwithaminimumresistivityof1MΩ-cmatroomtemperatureshallbeused.TestMethodA101D（RevisionofTestMethodA101C）

JEDECStandardNo.22-A101DPage23TestConditionsTestconditionsconsistofatemperature,relativehumidity,anddurationusedinconjunctionwithanelectricalbiasconfigurationspecifictothedevice.3.1Temperature,RelativeHumidityandDurationTemperature1[dry-bulb°C]85±2NOTE1NOTE2RelativeHumidity1[%]85±5Temperature2[wet-bulb,°C]81.0VaporPressure2[kPa（psia）]49.1（7.12）Duration3[hours]Typ.1000+168/-24Tolerancesapplytotheentireuseabletestarea.Forinformationonly.NOTE3Thetestconditionsaretobeappliedcontinuouslyexceptduringanyinterimreadouts.Forinterimreadouts,devicesshouldbereturnedtostresswithinthetimespecifiedin4.5.3.2BiasingguidelinesApplyeitherofthetwomethodsofbiasaccordingtothefollowingguidelines:

a）Minimizepowerdissipation.b）Alternatepinbiasasmuchaspossible.c）Distributepotentialdifferencesacrosschipmetallizationasmuchaspossible.d）Maximizevoltagewithinoperatingrange.NOTEThepriorityoftheaboveguidelinesdependsonmechanismandspecificdevicecharacteristics.e）Eitheroftwomethodsofbiascanbeusedtosatisfytheseguidelines,whicheverismoresevere:

1）Continuousbias:

Thedcbiasshallbeappliedcontinuously.Continuousbiasismoreseverethancycledbiaswhenthedietemperatureis≤10°Chigherthanthechamberambienttemperature.Ifthedietemperatureisnotknown,whentheheatdissipationofthedeviceundertest（DUT）islessthan200mW.IftheheatdissipationoftheDUTexceeds200mW,thenthedietemperatureshouldbecalculated.Ifthedietemperatureexceedsthechamberambienttemperaturebymorethan5°Cthenthedietemperatureriseabovethechamberambientshouldbeincludedinreportsoftestresultssinceaccelerationoffailuremechanismswillbeaffected.TestMethodA101D（RevisionofTestMethodA101C）

JEDECStandardNo.22-A101DPage33.2Biasingguidelines（cont’d）2）Cycledbias:

Thedcvoltageappliedtothedevicesundertestshallbeperiodicallyinterruptedwithanappropriatefrequencyanddutycycle.Ifthebiasingconfigurationresultsinatemperatureriseabovethechamberambient,ΔTja,exceeding10°C,thencycledbias,whenoptimizedforaspecificdevicetype,willbemoreseverethancontinuousbias.Heatingasaresultofpowerdissipationtendstodrivemoistureawayfromthedieandtherebyhindersmoisture-relatedfailuremechanisms.Cycledbiaspermitsmoisturecollectiononthedieduringtheoffperiodswhendevicepowerdissipationdoesnotoccur.CyclingtheDUTbiaswithonehouronandonehouroffisoptimalformostplastic-encapsulatedmicrocircuits.Thedietemperature,ascalculatedonthebasisoftheknownthermalimpedanceanddissipation,shouldbequotedwiththeresultswheneveritexceedsthechamberambientby5°Cormore.3.2.1ChoosingandreportingCriteriaforchoosingcontinuousorcyclicalbias,andwhetherornottoreporttheamountbywhichthedietemperatureexceedsthechamberambienttemperature,aresummarizedinthetable:

ΔTjaΔTja<5°C,orPowerperDUT<200mW（ΔTja≥5°CorPowerperDUT≥200mW）,andΔTja<10°CΔTja≥10°CCyclicalBias?

NoNoReportΔTja?

NoYesYes1YesCyclingtheDUTbiaswithonehouronandonehouroffisoptimalformostplasticencapsulatedmicrocircuits14ProceduresThetestdevicesshallbemountedinamannerthatexposesthemtoaspecifiedconditionoftemperatureandhumiditywithaspecifiedelectricalbiasingcondition.Exposureofdevicestoexcessivelyhot,dryambientorconditionsthatresultincondensationondevicesandelectricalfixturesshallbeavoided,particularlyduringramp-upandramp-down.Appropriateattentionshouldalsobemadetoavoidanywaterdrippingonthedevicesunderstress.4.1Ramp-upThetimetoreachstabletemperatureandrelativehumidityconditionsshouldbelessthan3hours.Condensationonthedevicesunderstressand/orfixtures/hardwareshallbeavoidedatalltimesbyensuringthattheirtemperatureisalwayshigherthanthedewpointtemperature.TestMethodA101D（RevisionofTestMethodA101C）

JEDECStandardNo.22-A101DPage44.2Ramp-downRamp-downshouldbelessthan3hours.Condensationshallbeavoidedbyensuringthatthetestchamber（dry-bulb）temperatureexceedsthewetbulbtemperatureatalltimesduringramp-down.NOTEForaDUTwithacavitiyinthepackage,condensationontheinternalsurfacemayoccurduetolengthoframp-downtime.4.3TestClockThetestclockstartswhenthetemperatureandrelativehumidityreachthesetpoints,andstopsatthebeginningoframp-down.4.4BiasBiasapplicationduringramp-upandramp-downisoptional.Biasshouldbeverifiedafterdevicesareloaded,priortothestartofthetestclock.Biasshouldalsobeverifiedafterthetestclockstops,butbeforedevicesareremovedfromthechamber.4.5ReadoutElectricaltestshallbeperformednotlaterthan48hoursaftertheendoframp-down.Forintermediatereadouts,devicesshallbereturnedtostresswithin96hoursoftheendoframp-down.Therateofmoisturelossfromdevicesafterremovalfromthechambercanbereducedbyplacingthedevicesinsealedmoisturebarrierbags（withoutdesiccant）.Whendevicesareplacedinsealedbags,the"testwindowclock"runsat1/3ofthe