大学物理实验报告英文版--X光Word格式文档下载.doc
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Amoresophisticatedx-raydetectoristheso-calledGeiger-Mullercounter,aninstrumentfordetectingthepresenceofandmeasuringionizingradiationsuchasthex-rays.Itconvertstheintensityofthex-rayintocountingrates.Wewillusesuchadeviceinourlab.
Attenuationofx-rays:
Whenpassingthroughamaterial,x-raycanbeattenuatedbyE&
Minteractions.Foraslabofthicknessx,thetransmission(definedastheratioofthetransmittedradiationtotheincoming),.µ
istheattenuationcoefficient,withadimensionof1/distance.µ
isacharacterofthematerial,anditvaries,forexample,asafunctionofatomicnumber.Wewillstudythisdependenceinthislab.
BraggDiffraction
Likenormallights,whenx-raytransmitthroughmaterialwithregularopticalpattern(e.g.lattice),diffractionwillhappenifthewavelengthofthex-rayisclosetothelatticespace.Suchdiffractiononthecrystalistheso-calledBraggDiffraction.Ifthelatticespacingisd,andthex-rayandthecrystalsurfaceformsanangleq,theanglewheremaximumdiffractionhappenswillsatisfy
wherenisanintegerandlisthewavelength.
Labequipment:
Theequipmentisanx-raylabsystemmadebyLeyboldInc.Aschematicisshownbelow.
Thex-rayisgeneratedbyanelectronbeamwithcontrollableenergy(viathepotential)andcurrent.Thex-rayisgoingintothedetectionchambertotheright.Thereisaremovableaperturewhichfocusesthex-ray,arotatablesampleholder,andarotatableG-Mcounter.Attherightendofthewall,thereisafluorescencescreenforimagine.
Operationdetailsofthedevicewillbegivenbythemanual.Basically,youneedtosetthehighvoltage(U)whichdeterminetheenergyofthex-ray,thecurrent(I),andtheangleofthesampleholder(target)orthedetector.Aknobcanbeusedtomaketheadjustmentonselectedparameters.“Coupled”movementmeansonemovesthetargetandthedetectortogether,theformerbyananglea,andthelatterbyanangle2a.Makesuretheleadglasswindowisclosedbeforeyouturnonthehighvoltage.
Attenuator(target)
Left:
aluminumattenuatormountedonacurvedplatewiththicknessof0,0.5,1.0,1.5,2.0,2.5,and3mm.Onecanselectdifferentthicknessbyselectingangle.
Right:
attenuationofdifferentmaterials,allwithathicknessof0.5mm,includingPolystyrene(averageZ=6),Aluminum(13),Iron(26),Copper(29),Zirconium(40)andSilver(47).
2.Installtheaperture.InstalltheZrfoilontotheaperture.ThisistofilterouttheKαline.SqueezetheNaClcrystalontothesampleholder.InthispartoftheprocedureweneedtomakesurethattheXraybeam,thecrystalsurfaceandthedetectorisaligned.UsethefollowingalignmentprocedurebytheBraggDiffraction,theprocessisomitted.
data:
Thefirstpeakappearswhenit’s7.5degree.
1.analysis:
Then,m.
Thatis,thewavelengthofXrayism.
2.MeasuretheXrayattenuationtodifferentthickness:
InstalltheZrfoilontotheaperture.SetHV=21kV,I=0.05mA,Db=0,Dt=100s.Hittargetkey.Changetheanglesequentiallyto0,10,20,30,40,50,60degree(thethicknessoftheattenuationincreaseby0.5mmeachstep).Foreachofthissetting,hit“scan”totakethedata,andhit“replay”togettheaveragerate.
attenuationofdifferentthickness
thickness(mm)
0.5
1
1.5
2
2.5
3
Data(1/s)
21.4
9.6
4.4
2.8
1.7
Fittherateasafunctionofthickness(withbackgroundsubtraction)togettheattenuationcoefficient.Fitthedatainoriginwithexponentialfit(mode=expdec1),throughequation.Weformthegraphof1/Tandx.So,wegetthat
Hence,So,theattenuationcoefficientis.
MeasuretheXrayattenuationtomaterialswithdifferentatomicmass:
a)RemovetheZrfilter.InsertthecurvedattenuatorholderB(differenttarget)intotheannulusslotontheplasticmount.SetHV=30kV,I=1mA,Db=0,Dt=100s.Hittargetkey.Changetheanglesequentiallyto0,10,20,30,40,50,60degree,eachcorrespondingtoagivenmaterial.
b)Foreachofthissetting,hit“scan”totakethedata,andhit“replay”togettheaveragerate.
c)ForthescanwithZrfilter.
attenuationofdifferentZ,withZr
Z
6
13
26
29
40
47
9117.9
7627.4
72.9
7.7
108.9
14.4
Noexactrulecanbefound.
InstalltheZrfilter.RepeatofZnumber.Thegraphturnsout:
attenuationofdifferentZ,withoutZr
9025.4
9027.8
8308.4
75.2
5.2
74.8
PlottherateasafunctionofZnumber.
Also,noexactrulecanbefound.
Conclusion:
1.thewavelengthofXrayism.
2.TheratehasnoexactrelationshipwithZ.
Error:
WhetherIcheckthebackgroundornotwillhaveainfluenceonthewavelength.
ThelightintheroomwillmaybeinfluencethedataIgot.WhenIdidtheexperimentwiththelighton,thusthelightwillbestronger.